Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004 (2004), pp. 427-429.
(2003), pp. 184-189.
Optoelectronic and Microelectronic Materials and Devices, 2006 Conference on (2006), pp. 121-124.
(2005), pp. 14-20.
by David
Lewis, Elias
Ahmed, Gregg
Baeckler, Vaughn
Betz, Mark
Bourgeault, David
Cashman, David
Galloway, Mike
Hutton, Chris
Lane, Andy
Lee, Paul
Leventis, Sandy
Marquardt, Cameron
Mcclintock, Ketan
Padalia, Bruce
Pedersen, Giles
Powell, Boris
Ratchev, Srinivas
Reddy, Jay
Schleicher, Kevin
Stevens, Richard
Yuan, Richard
Cliff, Jonathan
Rose
(30 November 2003)
Custom Integrated Circuits, 1999. Proceedings of the IEEE 1999 (1999), pp. 171-174.
Field-Programmable Technology, 2004. Proceedings. 2004 IEEE International Conference on (2004), pp. 41-48.
(1999), pp. 274-281.
ACM Trans. Des. Autom. Electron. Syst., Vol. 1, No. 1. (January 1996), pp. 80-101.
(1997), pp. 60-66.
Low Power Electronics and Design, 1999. Proceedings. 1999 International Symposium on (1999), pp. 188-193.
Low Power Electronics and Design, 2003. ISLPED '03. Proceedings of the 2003 International Symposium on (2003), pp. 134-139.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 12, No. 10. (2004), pp. 1015-1027.
(2002), pp. 19-28.
(2002), pp. 11-18.
(2003), pp. 12-20.
by David
Lewis, Vaughn
Betz, David
Jefferson, Andy
Lee, Chris
Lane, Paul
Leventis, Sandy
Marquardt, Cameron
Mcclintock, Bruce
Pedersen, Giles
Powell, Srinivas
Reddy, Chris
Wysocki, Richard
Cliff, Jonathan
Rose
(2006), pp. 45-51.
Electron Devices, IEEE Transactions on, Vol. 49, No. 11. (2002), pp. 2001-2007.
SOC Conference, 2004. Proceedings. IEEE International (2004), pp. 335-339.
(2005), pp. 131-136.
(2003)
IEEE Trans. Very Large Scale Integr. Syst., Vol. 9, No. 6. (December 2001), pp. 963-973.
(1999), pp. 420-424.
Design Automation Conference, 2001. Proceedings (2001), pp. 798-803.
VLSI Circuits, 2001. Digest of Technical Papers. 2001 Symposium on (2001), pp. 195-198.
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, Vol. 21, No. 8. (2002), pp. 904-915.
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, Vol. 8, No. 2. (2000), pp. 195-206.
Design Automation Conference, 2004. Proceedings. 41st (2004), pp. 381-384.
(2001), pp. 798-803.
Embedded Systems for Real-Time Multimedia, 2005. 3rd Workshop on (2005), pp. 41-46.
(2007), pp. 369-380.
Microarchitecture, 2007. MICRO 2007. 40th Annual IEEE/ACM International Symposium on (2007), pp. 3-14.
(2002), pp. 211-222.
International Journal of Solids and Structures, Vol. 45, No. 13. (30 June 2008), pp. 3769-3778.
Proceedings of the IEEE, Vol. 93, No. 8. (2005), pp. 1459-1467.
Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International (2004), pp. 627-628.
Metrology, Inspection, and Process Control for Microlithography XIV, Vol. 3998, No. 1. (2000), pp. 882-892.
Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 2004. EuroSimE 2004. Proceedings of the 5th International Conference on (2004), pp. 83-90.
Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 2004. EuroSimE 2004. Proceedings of the 5th International Conference on (2004), pp. 15-16.
Device and Materials Reliability, IEEE Transactions on, Vol. 4, No. 3. (2004), pp. 450-456.
Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International (2003), pp. 35.1.1-35.1.4.
Electron Devices, IEEE Transactions on, Vol. 51, No. 12. (2004), pp. 2168-2174.
Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the (2004), pp. 177-180.
Electron Devices, IEEE Transactions on, Vol. 49, No. 4. (2002), pp. 590-597.
Thermal and Thermomechanical Phenomena in Electronic Systems, 2004. ITHERM '04. The Ninth Intersociety Conference on, Vol. 2 (2004), pp. 137-144 Vol.2.
Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International (2003), pp. 35.2.1-35.2.4.
by M
Tada, Y
Harada, T
Tamura, N
Inoue, F
Ito, M
Yoshiki, H
Ohtake, M
Narihiro, M
Tagami, M
Ueki, K
Hijioka, M
Abe, T
Takeuchi, S
Saito, T
Onodera, N
Furutake, K
Arai, K
Fujii, Y
Hayashi
Semiconductor Manufacturing, 2003 IEEE International Symposium on (2003), pp. 454-456.
Physical and Failure Analysis of Integrated Circuits, 2003. IPFA 2003. Proceedings of the 10th International Symposium on the (2003), pp. 59-62.
VLSI Technology, 2003. Digest of Technical Papers. 2003 Symposium on (2003), pp. 109-110.
Semiconductor Manufacturing, IEEE Transactions on, Vol. 18, No. 3. (2005), pp. 341-349.