Spatially Resolved Raman Spectroscopy of Single- and Few-Layer Graphene

@article{citeulike:2447680, abstract = {Abstract: We present Raman spectroscopy measurements on single- and few-layer graphene flakes. By using a scanning confocal approach, we collect spectral data with spatial resolution, which allows us to directly compare Raman images with scanning force micrographs. Single-layer graphene can be distinguished from double- and few-layer by the width of the D' line: the single peak for single-layer graphene splits into different peaks for the double-layer. These findings are explained using the double-resonant Raman model based on ab initio calculations of the electronic structure and of the phonon dispersion. We investigate the D line intensity and find no defects within the flake. A finite D line response originating from the edges can be attributed either to defects or to the breakdown of translational symmetry.}, address = {Solid State Physics Laboratory, ETH Zurich, 8093 Zurich, Switzerland, Micro and Nanosystems, ETH Zurich, 8092 Zurich, Switzerland, and Institute for Electronics, Microelectronics, and Nanotechnology (IEMN), CNRS-UMR 8520, B.P. 60069, 59652 Villeneuve d'Ascq Cedex, France}, author = {Graf, D. and Molitor, F. and Ensslin, K. and Stampfer, C. and Jungen, A. and Hierold, C. and Wirtz, L. }, citeulike-article-id = {2447680}, doi = {http://dx.doi.org/10.1021/nl061702a}, journal = {Nano Lett.}, keywords = {experiment, graphene, graphene-substrate, morphology, nano-letters}, month = {February}, number = {2}, pages = {238--242}, posted-at = {2008-07-16 19:24:01}, priority = {2}, title = {Spatially Resolved Raman Spectroscopy of Single- and Few-Layer Graphene}, url = {http://dx.doi.org/10.1021/nl061702a}, volume = {7}, year = {2007} }

TY - JOUR ID - citeulike:2447680 L3 - citeulike-article-id:2447680 TI - Spatially Resolved Raman Spectroscopy of Single- and Few-Layer Graphene JF - Nano Lett. VL - 7 IS - 2 SP - 238 EP - 242 AD - Solid State Physics Laboratory, ETH Zurich, 8093 Zurich, Switzerland, Micro and Nanosystems, ETH Zurich, 8092 Zurich, Switzerland, and Institute for Electronics, Microelectronics, and Nanotechnology (IEMN), CNRS-UMR 8520, B.P. 60069, 59652 Villeneuve d'Ascq Cedex, France N2 - Abstract: We present Raman spectroscopy measurements on single- and few-layer graphene flakes. By using a scanning confocal approach, we collect spectral data with spatial resolution, which allows us to directly compare Raman images with scanning force micrographs. Single-layer graphene can be distinguished from double- and few-layer by the width of the D' line: the single peak for single-layer graphene splits into different peaks for the double-layer. These findings are explained using the double-resonant Raman model based on ab initio calculations of the electronic structure and of the phonon dispersion. We investigate the D line intensity and find no defects within the flake. A finite D line response originating from the edges can be attributed either to defects or to the breakdown of translational symmetry. KW - experiment KW - graphene KW - graphene-substrate KW - morphology KW - nano-letters AU - Graf, D AU - Molitor, F AU - Ensslin, K AU - Stampfer, C AU - Jungen, A AU - Hierold, C AU - Wirtz, L PY - 2007/02/14/ UR - http://dx.doi.org/10.1021/nl061702a ER -