Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever

by: Tomas R Rodriguez, Ricardo Garcia

Applied Physics Letters, Vol. 84, No. 3. (2004), pp. 449-451.

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Abstract

We propose a method for mapping the composition of a surface by using an amplitude modulation atomic force microscope operated without tip-surface mechanical contact. The method consists in exciting the first two modes of the microcantilever. The nonlinear dynamics of the tip motion, the coupling of its first two modes, and the sensitivity of the second mode to long-range attractive forces allows us to use this mode to probe compositional changes while the signal from the first mode is used to image the sample surface. We demonstrate that the second mode has a sensitivity to surface force variations below 10–11 N. ©2004 American Institute of Physics.

@article{citeulike:1082368, abstract = {We propose a method for mapping the composition of a surface by using an amplitude modulation atomic force microscope operated without tip-surface mechanical contact. The method consists in exciting the first two modes of the microcantilever. The nonlinear dynamics of the tip motion, the coupling of its first two modes, and the sensitivity of the second mode to long-range attractive forces allows us to use this mode to probe compositional changes while the signal from the first mode is used to image the sample surface. We demonstrate that the second mode has a sensitivity to surface force variations below 10\&\#150;11 N. \©2004 American Institute of Physics.}, author = {Rodriguez, Tomas R. and Garcia, Ricardo }, citeulike-article-id = {1082368}, doi = {http://dx.doi.org/10.1063/1.1642273}, journal = {Applied Physics Letters}, keywords = {compositional, eigenmodes, hamaker, mapping}, number = {3}, pages = {449--451}, posted-at = {2007-02-01 19:06:42}, priority = {2}, publisher = {AIP}, title = {Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever}, url = {http://dx.doi.org/10.1063/1.1642273}, volume = {84}, year = {2004} }

RIS record

TY - JOUR ID - citeulike:1082368 L3 - citeulike-article-id:1082368 TI - Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever JF - Applied Physics Letters VL - 84 IS - 3 SP - 449 EP - 451 PB - AIP N2 - We propose a method for mapping the composition of a surface by using an amplitude modulation atomic force microscope operated without tip-surface mechanical contact. The method consists in exciting the first two modes of the microcantilever. The nonlinear dynamics of the tip motion, the coupling of its first two modes, and the sensitivity of the second mode to long-range attractive forces allows us to use this mode to probe compositional changes while the signal from the first mode is used to image the sample surface. We demonstrate that the second mode has a sensitivity to surface force variations below 1011 N. ©2004 American Institute of Physics. KW - compositional KW - eigenmodes KW - hamaker KW - mapping AU - Rodriguez, Tomas AU - Garcia, Ricardo PY - 2004/// UR - http://dx.doi.org/10.1063/1.1642273 ER -

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