Determining lifetime in silicon blocks and wafers with accurate expressions for carrier density

@article{citeulike:2711881, author = {Bowden, Stuart and Sinton, Ronald A. }, citeulike-article-id = {2711881}, journal = {Journal of Applied Physics}, keywords = {jap}, number = {12}, posted-at = {2008-04-24 07:54:55}, priority = {2}, publisher = {AIP}, title = {Determining lifetime in silicon blocks and wafers with accurate expressions for carrier density}, url = {http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal\&id=JAPIAU000102000012124501000001\&idtype=cvips\&gifs=yes}, volume = {102}, year = {2007} }

TY - JOUR ID - citeulike:2711881 L3 - citeulike-article-id:2711881 TI - Determining lifetime in silicon blocks and wafers with accurate expressions for carrier density JF - Journal of Applied Physics VL - 102 IS - 12 PB - AIP KW - jap AU - Bowden, Stuart AU - Sinton, Ronald PY - 2007/// UR - http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=JAPIAU000102000012124501000001&idtype=cvips&gifs=yes ER -