Surface Roughness of Water Measured by X-Ray Reflectivity

by: A Braslau, M Deutsch, PS Pershan, AH Weiss, J Als-Nielsen, J Bohr

Physical Review Letters, Vol. 54, No. 2. (14 January 1985), 114.

View FullText article

DOI, PROLA (abstract), PROLA (pdf)

Reviews [Write a review of this article]

There are no reviews of this article

Notes for this article

torikai has 1 private note и ещё 0 public notes for this article. If you are torikai then you can log in to see the private note.

Find related articles from these CiteULike users

torikai

Find related articles with these CiteULike tags

experiment, liquid-crystal, surface, surface-order-enhancement, wetting

Abstract

The roughness of the liquid-vapor interface for pure water was measured by a technique of x-ray reflectivity. With synchrotron radiation (λ∼1.5 ÅA); the angular dependence of the x-ray reflectivity was measured from grazing incidence (∼0.0021 rad); where the reflectivity was greater than 0.96; to an incident angle of ∼0.05 rad; where the reflectivity was ∼7×10 -8 . A fit to the data by a theory with only one adjustable parameter obtains 3.2 ÅA for the root-mean-square roughness of the water surface.

@article{citeulike:1466295, abstract = {The roughness of the liquid-vapor interface for pure water was measured by a technique of x-ray reflectivity. With synchrotron radiation (λ∼1.5 \r{A}A); the angular dependence of the x-ray reflectivity was measured from grazing incidence (∼0.0021 rad); where the reflectivity was greater than 0.96; to an incident angle of ∼0.05 rad; where the reflectivity was ∼7×10 -8 . A fit to the data by a theory with only one adjustable parameter obtains 3.2 \r{A}A for the root-mean-square roughness of the water surface.}, author = {Braslau, A. and Deutsch, M. and Pershan, P. S. and Weiss, A. H. and Als-Nielsen, J. and Bohr, J. }, citeulike-article-id = {1466295}, doi = {http://dx.doi.org/10.1103/PhysRevLett.54.114}, journal = {Physical Review Letters}, keywords = {experiment, liquid-crystal, surface, surface-order-enhancement, wetting}, month = {January}, number = {2}, pages = {114+}, posted-at = {2007-07-19 03:07:13}, priority = {2}, publisher = {American Physical Society}, title = {Surface Roughness of Water Measured by X-Ray Reflectivity}, url = {http://dx.doi.org/10.1103/PhysRevLett.54.114}, volume = {54}, year = {1985} }

RIS record

TY - JOUR ID - citeulike:1466295 L3 - citeulike-article-id:1466295 TI - Surface Roughness of Water Measured by X-Ray Reflectivity JF - Physical Review Letters VL - 54 IS - 2 SP - 114 PB - American Physical Society N2 - The roughness of the liquid-vapor interface for pure water was measured by a technique of x-ray reflectivity. With synchrotron radiation (λ∼1.5 ÅA); the angular dependence of the x-ray reflectivity was measured from grazing incidence (∼0.0021 rad); where the reflectivity was greater than 0.96; to an incident angle of ∼0.05 rad; where the reflectivity was ∼7×10 -8 . A fit to the data by a theory with only one adjustable parameter obtains 3.2 ÅA for the root-mean-square roughness of the water surface. KW - experiment KW - liquid-crystal KW - surface KW - surface-order-enhancement KW - wetting AU - Braslau, A AU - Deutsch, M AU - Pershan, PS AU - Weiss, AH AU - Als-Nielsen, J AU - Bohr, J PY - 1985/01/14/ UR - http://dx.doi.org/10.1103/PhysRevLett.54.114 ER -

RIS BibTeX